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MCS,PHD
Argosy University/ Phoniex University/
Nov-2005 - Oct-2011
Professor
Phoniex University
Oct-2001 - Nov-2016
7.36 Transistor gain between emitter and collector in an integrated circuit device (hFE) is related to two variables (Myers, Montgomery, and Anderson-Cook, 2009) that can be controlled at the deposition pro- cess, emitter drive-in time (x1, in minutes) and emitter
dose (x2, in ions × 1014). Fourteen samples were ob-
served following deposition, and the resulting data are shown in the following table. We will consider linear re- gression models using gain as the response and emitter drive-in time or emitter dose as the regressor variable.
(a) Determine if emitter drive-in time influences gain in a linear relationship. That is, test H0: β1 = 0, where β1 is the slope of the regressor variable.
(b) Do a lack-of-fit test to determine if the linear rela- tionship is adequate. Draw conclusions.
(c) Determine if emitter dose influences gain in a linear relationship. Which regressor variable is the better predictor of gain?
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