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Category > Statistics Posted 28 May 2017 My Price 6.00

Seven oxide thickness measurements of wafers are studied to assess quality

Seven oxide thickness measurements of wafers are studied to assess quality in a semiconductor manufacturing process. The data (in angstroms) are 1264, 1280, 1301, 1300, 1292, 1307, and 1275. Calculate the sample average and sample standard deviation. Construct a dot diagram of the data

 

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Status NEW Posted 28 May 2017 07:05 AM My Price 6.00

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file 1495957071-2090201_1_636314756350045893_2090201.xlsx preview (62 words )
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