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bachelor in business administration
Polytechnic State University Sanluis
Jan-2006 - Nov-2010
CPA
Polytechnic State University
Jan-2012 - Nov-2016
Professor
Harvard Square Academy (HS2)
Mar-2012 - Present
Seven oxide thickness measurements of wafers are studied to assess quality in a semiconductor manufacturing process. The data (in angstroms) are 1264, 1280, 1301, 1300, 1292, 1307, and 1275. Calculate the sample average and sample standard deviation. Construct a dot diagram of the data
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