Maurice Tutor

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Category > Management Posted 11 Jul 2017 My Price 12.00

emiconductor manufacturing facility

A yield improvement study at a semiconductor manufacturing facility provided defect data for a sample of 450 wafers. The following table presents a summary of the responses to two questions: Were particles found on the die that produced the wafer? and Is the wafer good or bad?

a. Suppose you know that a wafer is bad. What is the probability that it was produced from a die that had particles?

b. Suppose you know that a wafer is good. What is the probability that it was produced from a die that had particles?

c. Are the two events, a good wafer and a die with no particles, statistically independent? Explain.

Answers

Maurice Tutor
(5)
Status NEW Posted 11 Jul 2017 01:07 PM My Price 12.00

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